John T. Grant

2 DAYS: Monday 16 & Tuesday 17 September 2019

Instructor

The courses are being taught by John T. Grant, who has over 40 years experience in surface analysis, and who has been teaching such courses for many years. He had been a Distinguished Research Scientist at the University of Dayton for over 30 years. He is now a consultant in surface science. He is co-editor of the book: Surface Analysis by Auger and X-ray Photoelectron Spectroscopy.


Who Should Attend?

Scientists, engineers, technicians, and students, who would like a detailed understanding of the principles and uses of XPS/ESCA for surface analysis and depth profiling.


Description and Objectives

XPS is used to determine the atoms present at a surface and their concentrations, chemistry, and lateral and depth distributions. This course is designed for scientists, engineers, technicians, and students, who would like a detailed understanding of the principles and uses of XPS/ESCA for surface analysis and depth profiling. Topics include the principles of XPS, instrumentation, qualitative analysis, quantitative analysis, artifacts, data acquisition and processing, imaging, and depth profiling. If you are planning to purchase equipment, this course will also aid in your selection of equipment.


Course Materials

Printed copy of all slides


Program

Day 1: 16 September 2019; 09:00-12:30 and 13:30-17:00

Introduction - terminology, surfaces, types of surfaces.

The principles of XPS - production of photoelectrons, peak labeling, electronic configuration of atoms, atoms, molecules, solids, binding energy, spectra, Auger process, valence spectra, surface sensitivity, information depth, hard x-rays, sample handling, identification of elements, backgrounds, spin-orbit splitting, chemical shift, plasmons, multiplet splitting, shake-up.

Instrumentation - dual anode, Bremsstrahlung, monochromatic source, synchrotrons, electron energy analyzers, spectrum acquisition, energy resolution, peak widths, lineshapes, electron detectors, pulse counting, position sensitive detectors, small area analysis, area location, imaging XPS, methods, equipment and examples, vacuum system, samples, energy scale calibration.

 

Day 2: 17 September 2019; 09:00-12:30 and 13:30-17:00

Qualitative analysis - identification of elements, changing x-ray sources, charging, relaxation effects, Auger parameter.

Quantitative analysis - sensitivity factors, ionization cross section, asymmetry parameter, analyzer transmission, reference spectra, intensities, background subtraction, detection limit, effect of thin overlayers.

Artifacts - x-ray damage, charging, methods for charge control, ghost peaks.

Data acquisition and processing - processing data, background subtraction, satellite subtraction, peak area, lineshapes, curve fitting, deconvolution.

Depth profiling - non-destructive and destructive methods, angle resolved XPS, diffraction, elastic scattering, thickogram, inelastic loss method, sputtering, depth calibration.

Applications - some further examples of applications of XPS.

Instrument selection and summary - factors to consider, general summary.

 

Registration fees

Type of registration Profile Fee
Short course only Regular 600 €
Student * 400 €
Short course fee for conference participants Regular 450 €
Student * 290 €
Coffee, soft drinks and a lunch in the IFW-Cafeteria are included.
Minimum Number of participants: 10

* A copy of the Student ID will be required to validate the registration.

 

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Important Dates

December 1, 2018
Online registration opening


February 1, 2019
Abstract submission opening (Call for papers)


March 11, 2019
Deadline Student Grants Application limit


April 22, 2019
Deadline for the abstract submission

Late poster submissions only on special request.

June 6, 2019
Information about acceptance of your abstract

June 30, 2019
Deadline for early bird registration

Organizer

 

With kind support of


 

 

Agency / Contact

Intercom Dresden GmbH
Intercom Dresden GmbH
Sylvia Neumann
Zellescher Weg 3
01069 Dresden, Germany
Phone
+49 351 32017320
Fax
+49 351 32017333

Technical support

EventClass GmbH | it - solutions for the event management / it - lösungen für das veranstaltungsmanagement
EventClass GmbH
it - solutions for the event management